90
|
NanoLab Inc
dualbeam field emission sem/fib microscope fei helios nanolab 600 Dualbeam Field Emission Sem/Fib Microscope Fei Helios Nanolab 600, supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/fib-sem+microscope+crossbeam+340/focused+ion+beam/10__1016_slash_j__ssi__2024__116702-66-10-17 Average 90 stars, based on 1 article reviews
dualbeam field emission sem/fib microscope fei helios nanolab 600 - by Bioz Stars,
2026-09
90/100 stars
|
Buy from Supplier |
86
|
Philips Healthcare
tecnai 10 microscope Tecnai 10 Microscope, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/fib-sem+microscope+crossbeam+340/electron+microscope+scanning+sem+%EB%AF%B8%EC%84%B8%EC%BA%A1%EC%8A%90%EC%9D%98+%EB%AF%B8%EC%84%B8%EC%BA%A1%EC%8A%90%EC%9D%98+%ED%81%AC%EA%B8%B0%EB%8A%94+%ED%8A%B9%EC%84%B1+%ED%91%9C%EB%A9%B4%EA%B3%BC/pmc12648009-69-25-27 Average 86 stars, based on 1 article reviews
tecnai 10 microscope - by Bioz Stars,
2026-09
86/100 stars
|
Buy from Supplier |
99
|
Bruker Corporation
x ray powder diffraction technique X Ray Powder Diffraction Technique, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/fib-sem+microscope+crossbeam+340/D8+ADVANCE/pm31495854-125-12-17 Average 99 stars, based on 1 article reviews
x ray powder diffraction technique - by Bioz Stars,
2026-09
99/100 stars
|
Buy from Supplier |
98
|
JEOL
ion beam scanning electron microscope Ion Beam Scanning Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more https://www.bioz.com/product/fib-sem+microscope+crossbeam+340/JSM-7600F+Scanning+Electron+Microscope/10__1016_slash_j__compositesb__2019__107328-65-20-37 Average 98 stars, based on 1 article reviews
ion beam scanning electron microscope - by Bioz Stars,
2026-09
98/100 stars
|
Buy from Supplier |